Volume: Vol-4182 SEBD 2025 | Year: 2025

Paper: « paper17 | paper26 | paper28 »

Optimizing Defect Detection: A Machine Learning-Ready Data Processing Pipeline

• Loredana Cristaldi
• Emilia Lenzi
• Davide Martinenghi
• Luca Martiri
• Andrea Moschetti
• Letizia Tanca
• Marco Zanoni

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